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NIKOS
MASTORAKIS
Technical University of Sofia, BULGARIA
RONALD YAGER, Iona College, New Rochelle, NY, USA
(honorary)
AMAURI CABALLERO, Florida International University,
Miami, FL, USA
GEORGE VACHTSEVANOS, Georgia Inst. of Technol., Atlanta,
GA, USA
ROBERT FINKEL, Physics Dept., St. John's University, USA
DEMETRIOS KAZAKOS, Texas Southern University, USA
THEODORE TRAFALIS, University of Oklahoma, USA
TAKIS KASPARIS, University of Central Florida, USA
ZHIQIANG GAO, Cleveland State University, Cleveland, OH,
USA
YAN WU, Georgia Southern University, Statesboro, GA, USA
SPYROS TRAGOUDAS, Southern Illinois University
Carbondale, IL, USA
ARKADY KHOLODENKO, Clemson University, USA
GREGORY BAKER, Ohio State Univ, Columbus, Ohio, USA
GALIGEKERE DATTATREYA, University of Texas at Dallas,
TX, USA
CAROLINE SWEEZY, New Mexico State University, USA
ASAD SALEM, Texas A&M University- Corpus Christi, USA
DIAN ZHOU, The University of Texas at Dallas, USA
METIN DEMIRALP, Istanbul Technical University, TURKEY
OLGA MARTIN, University Politehnica of Bucharest,
ROMANIA
PANOS PARDALOS, University of Florida, USA
CONSTANTIN UDRISTE, University Politehnica of Bucharest,
ROMANIA
KLEANTHIS PSARRIS, The University of Texas at San
Antonio, TX, USA
ANDREW D. JONES, Florida A&M University, Tallahassee,
FL, USA
VALERI MLADENOV, Technical University of Sofia, BULGARIA
NERI F., University of Piemonte Orientale, Alessandria,
ITALY
CHEN S. Y., Zhejiang University of Technology, P. R.
CHINA
SHYI-MING CHEN, Nat.Taiwan Univ. of Science & Techn,
Taipei, R.O.C.
YEN K., Florida International University, Miami, FL, USA
RONG-JYUE FANG, Southern Taiwan University of
Technology, TAIWAN
ARGYRIOS VARONIDES, University of Scranton, USA
NIKOLAI KOBASKO, R&D of �IQ Technologies Inc�, Akron,
Ohio, USA
XU ANPING, Hebei University of Technology, Tianjin
300130, P. R. CHINA
ZHU H., Hiroshima Kokusai Gakuin University, JAPAN
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* All the "Institute for
Environment, Engineering, Economics and Applied Mathematics" Publications
are included in the ISI, SCOPUS, ACM, WSEAS E-Library, IET (IEE),
ASM, ACS, CSA, ELSEVIER , ZENTRALBLATT, MATHSCINET, DPP,EI,
CSBA, Ulrigh, DEST, EBSCO, EMBASE, GEOBASE,
BIOBASE,BIOTECHNOBASE.
* All the "Institute for Environment, Engineering, Economics
and Applied Mathematics" Publications are archived in ISI, SCOPUS,
ACM, WSEAS E-Library, IET (IEE), ASM, ACS, CSA, ELSEVIER ,
ZENTRALBLATT, MATHSCINET, DPP,EI, CSBA, Ulrigh, DEST, EBSCO,
EMBASE, GEOBASE, BIOBASE,BIOTECHNOBASE.
* Authors will be invited to submit extended versions to an
"Institute for Environment, Engineering, Economics and
Applied Mathematics" or NAUN Journal or WSEAS Journal or University Press
or Springer
* In collaboration with the Institute of ElectroTechnics -
IET/GR, EUROPMENT, IASME, IARAS, WSEAS.
LOCATION:
PLENARY LECTURES
IMPORTANT DATES:
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*
Upload your
Paper
(Extended deadline: The organisers gave other 30
additional days)
* CONFERENCE DATES: SEPTEMBER 15-17, 2010
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FORMAT:
REGISTRATION FEES
The registration fees must be paid in EUR
550 EUR for every author
250 EUR for each additional paper
Extra Pages: free
It includes: Publication of your paper(s) in an ISI
Book (Thomson),
CD-ROM + Journals of "Institute for Environment,
Engineering, Economics and Applied Mathematics" (Journal: only the best
papers) with free PDF for all the academic community
after the conference, a previous book (from 2007 or
Journal), 2 coffee-breaks per day and one banquet in the
Hotel.
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SUBMIT A
PAPER
Write your paper in the correct
Format (All the papers must be in the correct "Institute
for Environment, Engineering, Economics and Applied
Mathematics"
format. Download it
from the following link )
Papers are invited on the topics outlined and others
falling within the scope of the meeting. Papers
should clearly state the purpose, results and
conclusions of the work to be described in the final
paper. Final acceptance will be based on the full-length
paper, which if accepted for publication, must be
presented at the conference. The language of the
conference will be English. Papers that are not in the
correct format will be rejected.
Upload your Paper now
Remark:
All submitted papers will have opportunities for
consideration for the Special Issues or Regular Issues
of several journals (some of them belong to ISI
category). The selection will be carried out during the
review process as well as at the conference presentation
stage. Submitted papers must not be under consideration
by any other journal or publication. The final decision
will be made based on peer review reports by the guest
editors and the Editor-in-Chief jointly. |
JOURNAL
All submitted papers will have opportunities for
consideration for the Special Issues or Regular Issues
of several journals (some of them belong to ISI
category). The selection will be carried out during the
review process as well as at the conference presentation
stage. Submitted papers must not be under consideration
by any other journal or publication. The final decision
will be made based on peer review reports by the guest
editors and the Editor-in-Chief jointly. |

CONFERENCE
PROGRAM
It will be available later ...
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Other Pictures
from the Place
TOPICS
Systems on a Chip
VLSI Circuits and Systems
Analog Circuits and Systems
Digital Circuits and Systems
Mixed-Mode Circuits and Data Converters
Consumer Electronics
Nonlinear Circuits and Systems
Optoelectronic Circuits
Power Electronics
Power Management
MEMS, Sensors and Sensory Systems
Nanotechnology
Communication Circuits and Systems
RF and High-Frequency Circuits
Wireless Communication Circuits and Systems
Circuit Level Implementation of RF-MEMS
Data Communication Circuits and Systems
Biomedical Circuits and Systems
Biologically Inspired Circuits and Systems
Cellular Neural Networks
Education
Neural Networks
Computer-Aided Design
System, Circuits, and Device Modelling
System, Circuits, and Device Simulation
Optimization
Design Automation
Digital Signal Processing
Speech Processing
Image Processing
Pattern Recognition
Visualization
Multimedia Systems
Computational Intelligence
Artificial Intelligence
Control Theory
Control Systems
Robotics
Fuzzy Logic
Identification
Fractals and Chaos
Applications
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Tel-Fax: 001 641 795 4411
Tel-Fax: 001 641 795 4415
Fax: 001 641 795 4419
EMAIL:
Upload your Paper now | |
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The "Institute for Environment, Engineering, Economics and
Applied Mathematics" Conferences are organized in Universities and
Hotels, where the reviewers were from the Universities and the
University is responsible for the review process based on the
contract of collaboration: University of Cambridge (UK), University of Harvard
(USA), Massachusetts Inst.of Technology - MIT (USA), China
Jiliang University (China), Beijing Jiaotong University (China),
University Paris-Sud (France), Federal University UFRN,
(Brazil), Romanian Academy of Science (Romania), Univ.
Politecnica of Bucharest (Romania), Technical University of
Sofia (Bulgaria), Tianjin University of Technology and Education
(China), The University of the West Indias (Trinidad & Tobago),
University of Cantabria, Santander, (Spain), Zhejiang Univ. of
Technology (China), University of Alcala, Madrid (Spain). These
universities completed the review process.
EUROPMENT
IARAS
University
Press

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